EP 2 XXX XXX B1 (synthetisch) • Art. 56 EPC Inventive Step
Art. 56 EPC Einwand: Bulk Locking Ratio als Design-Wahl
Technisches Umfeld und Art der Ablehnung.
| Patent | EP 2 XXX XXX B1 — Self-Locking Mechanic Fastener with Bulk Locking Ratio (synthetisch) |
| Tech Field | Mechanical fastener — hook-and-loop fastener arrays |
| OA Type | Examination Communication — Art. 56 EPC Inventive Step objection |
| Rejection | Claim 1 lacks inventive step; Examining Division says bulk locking ratio is a design choice, not a technical feature; D1 closest prior art, D3 also cited |
| Key Issue | New quantitative parameter vs. obvious design choice; PSA applicability |
Die beanspruchten Anspruche 1-3, wie ursprunglich eingereicht.
| Typ | Nr. | Inhalt |
|---|---|---|
| Unabhangig | 1 | A hook-and-loop fastener array comprising: a plurality of fastener elements arranged in rows and columns on a substrate, each fastener element comprising a stem and a head; wherein pockets are formed between adjacent stems within associated groups; characterized in that the array achieves a bulk locking ratio of at least 0.85, defined as the ratio of laterally retained fastener heads to total fastener heads in a test array of at least 100 elements, measured according to ISO 20920. |
| Abhangig | 2 | The fastener array of claim 1, wherein the bulk locking ratio is at least 0.92. |
| Unabhangig | 3 | A method of manufacturing a hook-and-loop fastener array according to claim 1, comprising: providing a substrate, forming fastener elements in rows and columns, testing a sample array of at least 100 elements, and adjusting stem spacing to achieve a bulk locking ratio of at least 0.85. |
ClaimForge's OA-Agent hat die Examination Communication strukturiert extrahiert.
Art. 56 EPC — claim 1 lacks inventive step
Rot markierte Anderungsvorschlage fur Anspruch 1 mit Spec-Ankern.
A hook-and-loop fastener array comprising:
a plurality of fastener elements arranged in rows and columns on a substrate,
each fastener element comprising a stem and a head;
wherein pockets are formed between adjacent stems within associated groups;
characterized in that:
(a) the fastener elements are arranged in a non-uniform density pattern wherein
stem spacing in a first zone differs from stem spacing in an adjacent second zone,
(b) the array achieves a bulk locking ratio of at least 0.85, defined as the ratio
of laterally retained fastener heads to total fastener heads in a test array of
at least 100 elements, measured according to ISO 20920, and
(c) the non-uniform density pattern increases lateral retention force by at least 15%
compared to a uniform density pattern with equivalent fastener count.
| Element | Zusammenfassung |
|---|---|
| 01 | Non-uniform density pattern: stem spacing varies between adjacent zones |
| 02 | Bulk locking ratio >= 0.85: quantifiable functional threshold |
| 03 | 15% force improvement vs. uniform density: technical effect |
Vollstandiger Entwurf der Erwiderung auf die Examination Communication.
Re-Search nach automatischer Anderung der Anspruche — Espacenet + Google Patents.
| Rank | Patent / Dokument | Score | Unterscheidung |
|---|---|---|---|
| 1 | EP 1 234 567 M microplastics, 2008 |
18/100 | Industrial fastener — no density variation, no bulk ratio |
| 2 | US8924938B2 Various, 2010 |
15/100 | Software testing fastener — unrelated |
| 3 | T 770/21 EPO Boa, 2023 |
35/100 | Self-locking planetary gear — related field, different domain |
| 4 | T 1721/23 EPO Boa, 2025 |
32/100 | Fin plug with recesses — lateral engagement, no density pattern |
| 5 | ISO 20920 Standard |
41/100 | Measurement standard — reference only |
Ergebnis der automatischen Chain-Analyse.
Zeitvergleich: manuell vs. ClaimForge Loop.
| Szenario | Stunden |
|---|---|
| Ohne ClaimForge | 22–30 h |
| ClaimForge Loop | 3 h |
| Netto-Ersparnis | 18–25 h |
Was ClaimForge in diesem Loop nicht abdeckt.
ClaimForge's autonomer Loop kann uber den gesamten Prosecution-Workflow eingesetzt werden — von der Prior-Art-Recherche uber Claim-Tree-Generierung bis zur Office-Action-Erwiderung, auch fur Mechanik-Patente mit quantitativen Parametern.